Nanoprober-based EBIC measurements for nanowire transistor...

Microelectronic Engineering 2013 / 5 Vol. 105

Nanoprober-based EBIC measurements for nanowire transistor structures

Arstila, K., Hantschel, T., Schulze, A., Vandooren, A., Verhulst, A.S., Rooyackers, R., Eyben, P., Vandervorst, W.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
105
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2012.08.006
Date:
May, 2013
File:
PDF, 1.01 MB
english, 2013
Conversion to is in progress
Conversion to is failed