Tracing the thermal behavior of ICs

IEEE Design & Test of Computers 1998 / April-June Vol. 15; Iss. 2

Tracing the thermal behavior of ICs

Szekely, V., Rencz, M., Courtois, B.
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Volume:
15
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/54.679204
Date:
January, 1998
File:
PDF, 314 KB
english, 1998
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