SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - Analysis of oversampling for noise reduction of UV image
Liu, Fei, Yuan, Yonggang, Cai, Nengbin, Ye, Baisong, Li, Xiangyang, Jiang, Yadong, Yu, Junsheng, Wang, ZhifengVolume:
8419
Year:
2012
Language:
english
DOI:
10.1117/12.975669
File:
PDF, 218 KB
english, 2012