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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Design and characterization of a large-area integrating sphere uniform radiation source for calibration of satellite remote sensors
He, Yingwei, Li, Ping, Feng, Guojin, Wang, Yu, Liu, Zhilong, Zheng, Chundi, Wu, Houping, Zong, Xiaoying, Zhang, Yufeng, Li, Yongqiang, Sha, Dingguo, Zhang, Yudong, Sasián, José, Xiang, Libin, To, SandVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.863270
File:
PDF, 332 KB
english, 2010