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FTIR Ellipsometry as a Tool for Studying Organic Layers: From Langmuir-Blodgett Films to Can Coatings
D. Tsankov, K. Hinrichs, A. Röseler, E.H. KorteVolume:
188
Year:
2001
Language:
english
Pages:
11
DOI:
10.1002/1521-396x(200112)188:43.0.co;2-v
File:
PDF, 161 KB
english, 2001