X-ray photoelectron spectroscopy (XPS) and diffraction...

Surface Science 2013 / 9 Vol. 615

X-ray photoelectron spectroscopy (XPS) and diffraction (XPD) study of a few layers of graphene on 6H-SiC(0001)

Ferrah, D., Penuelas, J., Bottela, C., Grenet, G., Ouerghi, A.
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Volume:
615
Language:
english
Journal:
Surface Science
DOI:
10.1016/j.susc.2013.04.006
Date:
September, 2013
File:
PDF, 2.37 MB
english, 2013
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