Transmission Electron Microscopy in Micro-Nanoelectronics (Claverie/Transmission Electron Microscopy in Micro-Nanoelectronics) || Dark-Field Electron Holography for Strain Mapping
Claverie, Alain, Mouis, MireilleYear:
2012
Language:
english
DOI:
10.1002/9781118579022.ch4
File:
PDF, 3.24 MB
english, 2012