System to measure accurate temperature dependence of electric conductivity down to 20 K in ultrahigh vacuum
Sakai, C., Takeda, S. N., Daimon, H.Volume:
84
Year:
2013
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4812336
File:
PDF, 1.66 MB
english, 2013