Exploring Spatial Resolution in Electron Back-Scattered Diffraction Experiments via Monte Carlo Simulation
Ren, S.X., Kenik, E.A., Alexander, K.B., Goyal, A.Volume:
4
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927698980011
Date:
February, 1998
File:
PDF, 1.42 MB
english, 1998