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[IEEE 2011 18th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2011) - Beirut, Lebanon (2011.12.11-2011.12.14)] 2011 18th IEEE International Conference on Electronics, Circuits, and Systems - Mixed symbolic-numerical techniques in fault diagnosis using fault rubber stamps
Al-Naima, Fawzi M., Al-Jewad, Bessam Z.Year:
2011
Language:
english
DOI:
10.1109/ICECS.2011.6122207
File:
PDF, 486 KB
english, 2011