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[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Thermal distribution during destructive pulses in ESD protection devices using a single-shot, two-dimensional interferometric method
Pogany, D., Bychikhin, S., Kuzmik, J., Dubec, V., Jensen, N., Denison, M., Groos, G., Stecher, M., Gornik, E.Year:
2002
Language:
english
DOI:
10.1109/IEDM.2002.1175849
File:
PDF, 393 KB
english, 2002