Impact of Interfacial Trap Density of States on the...

Chinese Physics Letters 2012 / 06 Vol. 29; Iss. 6

Impact of Interfacial Trap Density of States on the Stability of Amorphous InGaZnO-Based Thin-Film Transistors

Huang, Xiao-Ming, Wu, Chen-Fei, Lu, Hai, Xu, Qing-Yu, Zhang, Rong, Zheng, You-Dou
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Volume:
29
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/29/6/067302
Date:
June, 2012
File:
PDF, 645 KB
english, 2012
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