Atomic Resolution Mapping Using Quantitative High-angle...

Atomic Resolution Mapping Using Quantitative High-angle Annular Dark Field Scanning Transmission Electron Microscopy

Aert, S Van, Verbeeck, J, Bals, S, Erni, R, Dyck, D Van, Tendeloo, S Van
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927609093957
Date:
July, 2009
File:
PDF, 402 KB
english, 2009
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