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[IEEE 2009 IEEE Toronto International Conference - Science and Technology for Humanity (TIC-STH 2009) - Toronto, ON, Canada (2009.09.26-2009.09.27)] 2009 IEEE Toronto International Conference Science and Technology for Humanity (TIC-STH) - Advances in structural damage diagnostic research: Architectural design, modeling and validation
Kumar, Amar, Srivastava, Alka, Goel, Nita, Nayak, AmiyaYear:
2009
Language:
english
DOI:
10.1109/TIC-STH.2009.5444509
File:
PDF, 1.35 MB
english, 2009