Functional Yield Estimation of Carbon Nanotube-Based Logic...

IEEE Transactions on Nanotechnology 2010 / 11 Vol. 9; Iss. 6

Functional Yield Estimation of Carbon Nanotube-Based Logic Gates in the Presence of Defects

Ashraf, Rehman, Chrzanowska-Jeske, Malgorzata, Narendra, Siva G.
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Volume:
9
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/TNANO.2010.2058126
Date:
November, 2010
File:
PDF, 1.45 MB
english, 2010
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