[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Critical Fault-Based Pattern Generation for Screening SDDs
Bao, Fang, Peng, Ke, Yilmaz, Mahmut, Chakrabarty, Krishnendu, Winemberg, LeRoy, Tehranipoor, MohammadYear:
2011
Language:
english
DOI:
10.1109/ETS.2011.26
File:
PDF, 418 KB
english, 2011