A Simulated Annealing Inspired Test Optimization Method for...

Journal of Electronic Testing 2013 / 06 Vol. 29; Iss. 3

A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects

Shi, Yiwen, Dworak, Jennifer
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Volume:
29
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-013-5357-0
Date:
June, 2013
File:
PDF, 511 KB
english, 2013
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