[IEEE 21st International Conference on VLSI Design (VLSID...

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[IEEE 21st International Conference on VLSI Design (VLSID 2008) - Hyderabad, India (2008.01.4-2008.01.8)] 21st International Conference on VLSI Design (VLSID 2008) - An NoC Test Strategy Based on Flooding with Power, Test Time and Coverage Considerations

Sedghi, Mahshid, Koopahi, Elnaz, Alaghi, Armin, Fathy, Mahmood, Navabi, Zainalabedin
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Year:
2008
Language:
english
DOI:
10.1109/VLSI.2008.111
File:
PDF, 786 KB
english, 2008
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