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[NATO Science Series II: Mathematics, Physics and Chemistry] Defects in High-k Gate Dielectric Stacks Volume 220 || DEFECT ENERGY LEVELS IN HIGH-K GATE OXIDES
Gusev, EvgeniVolume:
10.1007/1-
Year:
2006
Language:
english
DOI:
10.1007/1-4020-4367-8_14
File:
PDF, 825 KB
english, 2006