[IEEE 2012 International Conference on Manipulation,...

  • Main
  • [IEEE 2012 International Conference on...

[IEEE 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Xi'an, China (2012.08.29-2012.09.1)] 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Technology of in situ charge promotes the development of MEMS safety and arming device

Jinlong, Zou, Xiaojie, Li, Yaru, Lei
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2012
Language:
english
DOI:
10.1109/3M-NANO.2012.6472987
File:
PDF, 1.07 MB
english, 2012
Conversion to is in progress
Conversion to is failed