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[IEEE EM2010) - Xiamen, China (2010.10.29-2010.10.31)] 2010 IEEE 17Th International Conference on Industrial Engineering and Engineering Management - Condition-based early stage diagnosis robust ant colony clustering algorithm and feature mapping
Yan, Ji-hong, Zhao, De-binYear:
2010
Language:
english
DOI:
10.1109/ICIEEM.2010.5646474
File:
PDF, 1.07 MB
english, 2010