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Ellipsometric light scattering for the characterization of thin layers on dispersed colloidal particles
Erbe, Andreas, Tauer, Klaus, Sigel, ReinhardVolume:
73
Language:
english
Journal:
Physical Review E
DOI:
10.1103/PhysRevE.73.031406
Date:
March, 2006
File:
PDF, 137 KB
english, 2006