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[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - 25 nm CMOS design considerations
Taur, Y., Wann, C.H., Frank, D.J.Year:
1998
Language:
english
DOI:
10.1109/IEDM.1998.746474
File:
PDF, 398 KB
english, 1998