Statistical tests for higher order analysis of radar...

IEEE Transactions on Aerospace and Electronic Systems 2005 / 01 Vol. 41; Iss. 1

Statistical tests for higher order analysis of radar clutter their application to L-band measured data

Conte, E., De Maio, A., Farina, A., Marconi, A.
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Volume:
41
Language:
english
Journal:
IEEE Transactions on Aerospace and Electronic Systems
DOI:
10.1109/TAES.2005.1413757
Date:
January, 2005
File:
PDF, 1.13 MB
english, 2005
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