How Good Is Your Tag?: RFID Backscatter Metrics and...

IEEE Microwave Magazine 2013 / 07 Vol. 14; Iss. 5

How Good Is Your Tag?: RFID Backscatter Metrics and Measurements

Kuester, Daniel, Popovic, Zoya
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Volume:
14
Language:
english
Journal:
IEEE Microwave Magazine
DOI:
10.1109/MMM.2013.2259394
Date:
July, 2013
File:
PDF, 3.62 MB
english, 2013
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