Depth Profiling and Melting of Nanoparticles in Secondary...

The Journal of Physical Chemistry C 2013 / 08 Vol. 117; Iss. 31

Depth Profiling and Melting of Nanoparticles in Secondary Ion Mass Spectrometry (SIMS)

Yang, Li, Seah, Martin P., Gilmore, Ian S., Morris, Richard J. H., Dowsett, Mark G., Boarino, Luca, Sparnacci, Katia, Laus, Michele
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Volume:
117
Language:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/jp4048538
Date:
August, 2013
File:
PDF, 1.51 MB
english, 2013
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