Automatic inspection system of LED chip using two-stages...

Journal of Intelligent Manufacturing 2014 / 12 Vol. 25; Iss. 6

Automatic inspection system of LED chip using two-stages back-propagation neural network

Kuo, Chung-Feng Jeffrey, Hsu, Chien-Tung Max, Liu, Zong-Xian, Wu, Han-Cheng
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Volume:
25
Language:
english
Journal:
Journal of Intelligent Manufacturing
DOI:
10.1007/s10845-012-0725-7
Date:
December, 2014
File:
PDF, 692 KB
english, 2014
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