[IEEE 2012 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in Rf Systems (SiRF) - Santa Clara, CA, USA (2012.01.16-2012.01.18)] 2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Impact of high frequency correlated noise on SiGe HBT low noise amplifier design
Shen, Pei, Niu, Guofu, Xu, Ziyan, Zhang, WanrongYear:
2012
Language:
english
DOI:
10.1109/SiRF.2012.6160163
File:
PDF, 157 KB
english, 2012