Characterization of Biaxial Anisotropic Material Using a...

IEEE Transactions on Instrumentation and Measurement 2013 / 10 Vol. 62; Iss. 10

Characterization of Biaxial Anisotropic Material Using a Reduced Aperture Waveguide

Crowgey, Benjamin R., Tuncer, Ozgur, Tang, Junyan, Rothwell, Edward J., Shanker, B., Kempel, Leo C., Havrilla, Michael J.
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/TIM.2013.2259752
Date:
October, 2013
File:
PDF, 514 KB
english, 2013
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