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SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Diagnostic Imaging Technologies and Industrial Applications - Experimental evaluation of CCD and CMOS cameras in low-light-level conditions
Laitinen, Jyrki, Ailisto, Heikki J., Lammasniemi, Jorma, Wiggenhauser, Herbert, Busse, Gerhard, Batchelor, Bruce G., Poelzleitner, Wolfgang, Dobmann, GerdVolume:
3827
Year:
1999
Language:
english
DOI:
10.1117/12.361002
File:
PDF, 1.09 MB
english, 1999