Measurement technology for material emissivity under high...

Measurement 2013 / 12 Vol. 46; Iss. 10

Measurement technology for material emissivity under high temperature dynamic heating conditions

Wang, Hui, Chen, Dejiang, Wang, Guolin, Long, Yongsheng, Luo, Jie, Liu, Liping, Yang, Qingtao
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Volume:
46
Language:
english
Journal:
Measurement
DOI:
10.1016/j.measurement.2013.07.041
Date:
December, 2013
File:
PDF, 996 KB
english, 2013
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