Reliability prediction of semiconductor devices using...

International Journal of System Assurance Engineering and Management 2013 / 03 Vol. 4; Iss. 1

Reliability prediction of semiconductor devices using modified physics of failure approach

Adithya Thaduri, Ajit Kumar Verma, V. Gopika…
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Volume:
4
Language:
english
DOI:
10.1007/s13198-013-0146-9
Date:
March, 2013
File:
PDF, 430 KB
english, 2013
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