SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Photogrammetric scale-bar measurement method based on microscopic image aiming
Gan, Xiao-chuan, He, Ming-zhao, Li, Lian-fu, Ye, Xiao-you, Li, Jian-shuang, Zhang, Yudong, Xiang, Libin, To, SandyVolume:
8417
Year:
2012
Language:
english
DOI:
10.1117/12.974264
File:
PDF, 390 KB
english, 2012