Crystalline quality and residual stresses in diamond layers by Raman and x-ray diffraction analyses
Rats, D., Bimbault, L., Vandenbulcke, L., Herbin, R., Badawi, K. F.Volume:
78
Year:
1995
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.359725
File:
PDF, 1.14 MB
english, 1995