Atomic Scale Analysis of Planar Defects in Polycrystalline...

Microscopy and Microanalysis 2006 / 12 Vol. 12; Iss. 6

Atomic Scale Analysis of Planar Defects in Polycrystalline Diamond

Erni, Rolf, Freitag, Bert, Hartel, Peter, Müller, Heiko, Tiemeijer, Peter, van der Stam, Michiel, Stekelenburg, Mike, Hubert, Dominique, Specht, Petra, Garibay-Febles, Vincente
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Volume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927606060594
Date:
December, 2006
File:
PDF, 601 KB
english, 2006
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