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Predicting leaf area index in wheat using an improved empirical model
Chen, Hanyue, Niu, Zheng, Huang, Wenjiang, Feng, JiluVolume:
7
Language:
english
Journal:
Journal of Applied Remote Sensing
DOI:
10.1117/1.JRS.7.073577
Date:
April, 2013
File:
PDF, 4.50 MB
english, 2013