![](/img/cover-not-exists.png)
[IEEE 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility - Beijing, China (2010.04.12-2010.04.16)] 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility - Radiated EMI prediction and mechanism modeling from measured noise of microcontroller
Han-Nien Lin,, Tai-jung Cheng,, Chih-Min Liao,Year:
2010
Language:
english
DOI:
10.1109/APEMC.2010.5475791
File:
PDF, 1.61 MB
english, 2010