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Photobias Instability of High Performance Solution Processed Amorphous Zinc Tin Oxide Transistors
Kim, Yoon Jang, Yang, Bong Seob, Oh, Seungha, Han, Sang Jin, Lee, Hong Woo, Heo, Jaeyeong, Jeong, Jae Kyeong, Kim, Hyeong JoonVolume:
5
Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/am400110y
Date:
April, 2013
File:
PDF, 2.88 MB
english, 2013