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Linear thermal expansion coefficient determination using in situ curvature and temperature dependent X-ray diffraction measurements applied to metalorganic vapor phase epitaxy-grown AlGaAs
Maaßdorf, A., Zeimer, U., Grenzer, J., Weyers, M.Volume:
114
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4812369
File:
PDF, 1.62 MB
english, 2013