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Equivalent target probability of failure to convert high-reliability model to low-reliability model for efficiency of sampling-based RBDO
Ikjin Lee, Jaekwan Shin, K. K. ChoiVolume:
48
Language:
english
DOI:
10.1007/s00158-013-0905-x
Date:
August, 2013
File:
PDF, 993 KB
english, 2013