Characterization of Cu-Sn/Pb diffusion zones of microelectronic contacts by means of electron probe microanalysis and ion beam sputtering
Siegfried Däbritz, Wolfgang HauffeVolume:
353
Language:
english
DOI:
10.1007/s0021653530271
Date:
October, 1995
File:
PDF, 341 KB
english, 1995