Characterization of Cu-Sn/Pb diffusion zones of...

Characterization of Cu-Sn/Pb diffusion zones of microelectronic contacts by means of electron probe microanalysis and ion beam sputtering

Siegfried Däbritz, Wolfgang Hauffe
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Volume:
353
Language:
english
DOI:
10.1007/s0021653530271
Date:
October, 1995
File:
PDF, 341 KB
english, 1995
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