![](/img/cover-not-exists.png)
Interpretation of sputter depth profiles by mixing simulations
G. Kupris, H. Rößler, G. Ecke, S. HofmannVolume:
353
Language:
english
DOI:
10.1007/BF00322057
Date:
October, 1995
File:
PDF, 371 KB
english, 1995