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Studies of Materials at the Nanometer Scale Using Coherent X-Ray Diffraction Imaging
Sandberg, Richard L., Huang, Zhifeng, Xu, Rui, Rodriguez, Jose A., Miao, JianweiVolume:
65
Language:
english
Journal:
JOM
DOI:
10.1007/s11837-013-0699-8
Date:
September, 2013
File:
PDF, 841 KB
english, 2013