In Situ Observation of Polytype Switches during SiC PVT...

Materials Science Forum 2009 Vol. 615-617

In Situ Observation of Polytype Switches during SiC PVT Bulk Growth by High Energy X-Ray Diffraction

Wellmann, Peter J., Konias, Katja, Hens, Philip, Hock, Rainer, Magerl, Andreas
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Volume:
615-617
Year:
2009
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.615-617.23
File:
PDF, 1.94 MB
english, 2009
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