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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Advances in X-Ray/EUV Optics and Components VII - Recent tests of x-ray spectrometers using polycapillary optics
Heald, Steve, Seidler, Gerald T., Mortensen, Devon, Mattern, Brian, Bradley, Joseph A., Hess, Nancy, Bowden, Mark, Goto, Shunji, Morawe, Christian, Khounsary, Ali M.Volume:
8502
Year:
2012
Language:
english
DOI:
10.1117/12.929960
File:
PDF, 2.47 MB
english, 2012