Ellipsometry studies of Si/Ge superlattices with embedded...

Applied Physics A: Materials Science & Processing 2013 / 09 Vol. 112; Iss. 3

Ellipsometry studies of Si/Ge superlattices with embedded Ge dots

Şeref Kalem, Örjan Arthursson, Peter Werner
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Volume:
112
Language:
english
DOI:
10.1007/s00339-013-7781-5
Date:
September, 2013
File:
PDF, 563 KB
english, 2013
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