Electronic properties of silicon-nitride films deposited by low-energy ion-beam bombardment
Zhong-Min Ren, Fang Lu, Yuan-Cheng Du, Zhi-Feng Ying, Fu-Ming LiVolume:
61
Language:
english
DOI:
10.1007/BF01542876
Date:
December, 1995
File:
PDF, 188 KB
english, 1995