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Determination of the impurity concentration in heavily doped inhomogeneous semiconductors from the measurement of the low-temperature conductivity
I. Shlimak, R. Ussyshkin, L. Resnick, V. GinodmanVolume:
61
Language:
english
DOI:
10.1007/BF01538375
Date:
July, 1995
File:
PDF, 275 KB
english, 1995