Radiation Hardness Assurance Testing of Microelectronic...

IEEE Transactions on Nuclear Science 2013 / 6 Vol. 60; Iss. 3

Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Test Guideline for Proton and Heavy Ion Single-Event Effects

Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E.
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2013.2261317
Date:
June, 2013
File:
PDF, 1.60 MB
english, 2013
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