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Experimental Investigation of DC-Bias Related Core Losses in a Boost Inductor
Kosai, Hiroyuki, Turgut, Zafer, Scofield, JamesVolume:
49
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/TMAG.2013.2242863
Date:
July, 2013
File:
PDF, 522 KB
english, 2013